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									[2013.08] Bias–stress-induced threshold voltage shift dependence of negative charge trapping in the amorphous indium tin zinc oxide thin-film transistors
								

								

									
										

											

												작성자: 관리자
												
																																					조회: 1646													등록일: 2022-03-18												
											

																					

											
								

								

									
								

								

								
									

									

									
									
										
							

							

								
						

						

							
				

				

					
						

							

								
									

									

										
												
												
											

									

										
							

						

							
				

			

				
	

	

		
			
			

        

         
      

				

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					  이전글
					 [2013.08] Poly-silicon thin-film transistors without active layer pattern for high current performance with large operational range
				

				

					   다음글
					 [2013.08] Light trapping scheme of ICP-RIE glass texturing by SF6/Ar plasma for high haze ratio
				

				

				

			

				
	

	

		
			

				
				

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	88
	
	[2013.11] Interfacial barrier height modification of indium tin oxide/a-Si:H(p) via control of densi...
	관리자
	
	
	1545
	2022-03-18




	


	87
	
	[2013.11] Improvement of haze ratio of DC (direct current)-sputtered ZnO:Al thin films through HF (h...
	관리자
	
	
	1522
	2022-03-18




	


	86
	
	[2013.11] Direct Metallization Local Al-Back Surface Field for High Efficiency Screen Printed Crysta...
	관리자
	
	
	1542
	2022-03-18




	


	85
	
	[2013.11] A buffer-layer/a-SiOx:H(p) window-layer optimization for thin film amorphous silicon based...
	관리자
	
	
	1678
	2022-03-18




	


	84
	
	[2013.10] Light management and efficient carrier generation with a highly transparent window layer f...
	관리자
	
	
	1573
	2022-03-18




	


	83
	
	[2013.10] Carrier Injection Related Stability of Intrinsic Hydrogenated Amorphous Silicon Film and S...
	관리자
	
	
	1615
	2022-03-18




	


	82
	
	[2013.10] Suppression of temperature instability in InGaZnO thin-film transistors by in situ nitroge...
	관리자
	
	
	1557
	2022-03-18




	


	81
	
	[2013.10] Diffused transmission and texture-induced defect with transparent conducting oxide front e...
	관리자
	
	
	1571
	2022-03-18




	


	80
	
	[2013.10] Si-rich SiNx rear passivated c-Si solar cell with a novel antimony Local Back Surface Fiel...
	관리자
	
	
	1653
	2022-03-18




	


	79
	
	[2013.10] Rear-side passivation characteristics of Si-rich SiNx for various Local Back Contact solar...
	관리자
	
	
	1553
	2022-03-18




	


	78
	
	[2013.10] Processed optimization for excellent interface passivation quality of amorphous/crystallin...
	관리자
	
	
	1632
	2022-03-18




	


	77
	
	[2013.10] Inserted Layer of AZO Thin Film with High Work Function Between Transparent Conductive Oxi...
	관리자
	
	
	1743
	2022-03-18




	


	76
	
	[2013.10] Growth Control of Carbon Nanotubes Using by Anodic Aluminum Oxide Nano Templates
	관리자
	
	
	1696
	2022-03-18




	


	75
	
	[2013.09] Influence of laser power on POCl3 diffused back surface field on n-type PERT silicon solar...
	관리자
	
	
	1650
	2022-03-18




	


	74
	
	[2013.08] High-Efficiency Heterojunction with Intrinsic Thin-Layer Solar Cells: A Review
	관리자
	
	
	1636
	2022-03-18




	

				
				

				

				

				

					
						

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