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									[2012.04] Spectroscopic ellipsometry analysis of amorphous silicon thin films for Si-nanocrystals
								

								

									
										

											

												작성자: 관리자
												
																																					조회: 1646													등록일: 2022-03-14												
											

																					

											
								

								

									
								

								

								
									

									

									
									
										
							

							

								
						

						

							
				

				

					
						

							

								
									

									

										
												
												
											

									

										
							

						

							
				

			

				
	

	

		
			
			

        

         
      

				

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					 [2012.04] Operation mechanism of Schottky barrier nonvolatile memory with high conductivity InGaZnO active layer
				

				

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					 [2012.04] Effect of carrier injection stress in thin film solar cells by impedance spectroscopy
				

				

				

			

				
	

	

		
			

				
				

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