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[2017.10] Electrical and optical characterization of SiOxNy and SiO2 dielectric layers and rear surface passivation by using SiO2/SiOxNy stack layers with screen printed local Al-BSF for c-Si solar cells
작성자: 관리자 조회: 1988 등록일: 2022-03-21
 
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  이전글  [2017.10] High-Speed, Self-Biased Broadband Photodetector-Based on a Solution-Processed Ag Nanowire/Si Schottky Junction
  다음글  [2017.08] Growth and Characterization of VO2 Thin Film by Pulsed DC Sputtering of Optical Switching Applications
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