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[2013.08] Light trapping scheme of ICP-RIE glass texturing by SF6/Ar plasma for high haze ratio
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  ÀÌÀü±Û  [2013.08] Bias–stress-induced threshold voltage shift dependence of negative charge trapping in the amorphous indium tin zinc oxide thin-film transistors
  ´ÙÀ½±Û  [2013.08] High field-effect mobility amorphous InSnZnO thin-film transistors with low carrier concentration and oxygen vacancy
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253 [2019.11] Design of High-Power and High-Density Photovoltaic Modules Based on a Shingled Cell String... °ü¸®ÀÚ 2584 2022-03-21
252 [2019.11] Investigation of boron-doped hydrogenated silicon films as a thermo-sensing layer for unco... °ü¸®ÀÚ 2530 2022-03-21
251 [2019.11] Corrosion behaviours of hot-extruded Al-xMg alloys °ü¸®ÀÚ 2490 2022-03-21
250 [2019.11] Controlling a crystalline seed layer for mirocrystalline silicon oxide window layer in rea... °ü¸®ÀÚ 2639 2022-03-21
249 [2019.10] Theoretical investigation of transparent front surface field layer on the performance of h... °ü¸®ÀÚ 2650 2022-03-21
248 [2019.10] Electrochemical supercapacitive studies of chemically deposited Co1-xNixS thin films °ü¸®ÀÚ 2492 2022-03-21
247 [2019.10] Tunnel oxide passivating electron contacts for high-efficiency n-type silicon solar cells ... °ü¸®ÀÚ 2779 2022-03-21
246 [2019.10] Porcelain suspension insulator for OHTL: A comparative study of new and used insulators us... °ü¸®ÀÚ 2733 2022-03-21
245 [2019.08] Novel synthesis method for quaternary Cd(Cu, Zn)Se thin films and its characterizations °ü¸®ÀÚ 2628 2022-03-21
244 [2019.08] Insight into the adsorption mechanisms of methylene blue and chromium(III) from aqueous so... °ü¸®ÀÚ 2544 2022-03-21
243 [2019.08] A reliability study of silicon heterojunction photovoltaic modules exposed to damp heat te... °ü¸®ÀÚ 2671 2022-03-21
242 [2019.07] Enhancement in Performance of Transparent p-NiO/n-ZnO Heterojunction Ultrafast Self-Powere... °ü¸®ÀÚ 2654 2022-03-21
241 [2019.05] Electrical and Structural Characteristics of Excimer Laser-Crystallized Polycrystalline Si... °ü¸®ÀÚ 2525 2022-03-21
240 [2019.05] Effects of post-metallisation annealing on surface–interfacial and electrical proper... °ü¸®ÀÚ 2411 2022-03-21
239 [2019.05] The Characteristics of Transparent Non-Volatile Memory Devices Employing Si-Rich SiOX as a... °ü¸®ÀÚ 2442 2022-03-21
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