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[2013.08] Light trapping scheme of ICP-RIE glass texturing by SF6/Ar plasma for high haze ratio
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  ÀÌÀü±Û  [2013.08] Bias–stress-induced threshold voltage shift dependence of negative charge trapping in the amorphous indium tin zinc oxide thin-film transistors
  ´ÙÀ½±Û  [2013.08] High field-effect mobility amorphous InSnZnO thin-film transistors with low carrier concentration and oxygen vacancy
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178 [2016.07] Role of SiOxNy surface passivation layer on stability improvement and kink effect reductio... °ü¸®ÀÚ 2143 2022-03-21
177 [2016.05] The effect of small pyramid texturing on the enhanced passivation and efficiency of single... °ü¸®ÀÚ 2138 2022-03-21
176 [2016.05] Influence of Oxygen Gas Ratio on the Properties of Aluminum-Doped Zinc Oxide Films Prepare... °ü¸®ÀÚ 2038 2022-03-21
175 [2016.05] Improvement in Front-Contact Resistance and Interface Passivation of Heterojunction Amorph... °ü¸®ÀÚ 1642 2022-03-21
174 [2016.05] Optimization of CdS Buffer Layer for High Efficiency CIGS Solar Cells °ü¸®ÀÚ 1720 2022-03-21
173 [2016.05] Method for Fabricating Textured High-Haze ZnO:Al Transparent Conduction Oxide Films on Che... °ü¸®ÀÚ 1587 2022-03-21
172 [2016.05] Improving Memory Characteristics of Hydrogenated Nanocrystalline Silicon Germanium Nonvola... °ü¸®ÀÚ 1533 2022-03-21
171 [2016.05] Hydrogenated Amorphous Silicon Germanium Active Layer for Top Cell of a Multi Junction Cel... °ü¸®ÀÚ 1525 2022-03-21
170 [2016.05] Fabrication of InGaZnO Nonvolatile Memory Devices at Low Temperature of 150 ¡ÆC for Applic... °ü¸®ÀÚ 1514 2022-03-21
169 [2016.05] Enhanced Haze Ratio on Glass by Novel Vapor Texturing Method °ü¸®ÀÚ 1459 2022-03-21
168 [2016.05] Effects of Low Temperature Anneal on the Interface Properties of Thermal Silicon Oxide for... °ü¸®ÀÚ 1544 2022-03-21
167 [2016.05] Effective Light Trapping in Thin Film Silicon Solar Cells with Nano- and Microscale Struct... °ü¸®ÀÚ 1548 2022-03-21
166 [2016.05] Boron Oxygen Pair Effect in p+ Emitter and Nanosized Boron Rich Layer by Fold Coordination... °ü¸®ÀÚ 1461 2022-03-21
165 [2016.03] Dislocation and Saturation Current Density Analysis by Rear-Side Al Amount Variation for n... °ü¸®ÀÚ 1644 2022-03-21
164 [2016.03] Analysis of Electrical Properties Variation by Phosphorus-Diffused Layer Profile Shape and... °ü¸®ÀÚ 1740 2022-03-21
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