133 |
[2014.07] Highly transparent RF magnetron-sputtered indium tin oxide films for a-Si:H/c-Si heterojun... |
°ü¸®ÀÚ |
1678 |
2022-03-18 |
|
132 |
[2016.05] Improvement in Front-Contact Resistance and Interface Passivation of Heterojunction Amorph... |
°ü¸®ÀÚ |
1678 |
2022-03-21 |
|
131 |
[2011.07] The effect of deposition RF power on the SiC passivation layer synthesized by an RF magnet... |
°ü¸®ÀÚ |
1676 |
2022-03-11 |
|
130 |
[2013.10] Processed optimization for excellent interface passivation quality of amorphous/crystallin... |
°ü¸®ÀÚ |
1674 |
2022-03-18 |
|
129 |
[2013.12] Enhancing Light Trapping Properties of Thin Film Solar Cells by Plasmonic Effect of Silver... |
°ü¸®ÀÚ |
1674 |
2022-03-18 |
|
128 |
[2015.06] High performance non-volatile memory with the control of charge trapping states in an amor... |
°ü¸®ÀÚ |
1674 |
2022-03-21 |
|
127 |
[2012.09] High mobility P-channel thin-film transistors with ultralarge-grain polycrystalline silico... |
°ü¸®ÀÚ |
1673 |
2022-03-18 |
|
126 |
[2013.05] Effect of the short collection length in silicon microscale wire solar cells |
°ü¸®ÀÚ |
1673 |
2022-03-18 |
|
125 |
[2013.05] Influence of SnO2:F/ZnO:Al bi-layer as a front electrode on the properties of p-i-n amorph... |
°ü¸®ÀÚ |
1673 |
2022-03-18 |
|
124 |
[2015.02] Effects of interface trap density on the electrical performance of amorphous InSnZnO thin-... |
°ü¸®ÀÚ |
1673 |
2022-03-21 |
|
123 |
[2023.04] Effect of Solder Flux on Resistive Solder Bond Hotspot Generation in Photovoltaic Module C... |
°ü¸®ÀÚ |
1673 |
2023-12-18 |
|
122 |
[2012.07] Selective emitter using a screen printed etch barrier in crystalline silicon solar cell |
°ü¸®ÀÚ |
1672 |
2022-03-18 |
|
121 |
[2012.10] Investigation of charge storage and retention characteristics of silicon nitride in NVM ba... |
°ü¸®ÀÚ |
1672 |
2022-03-18 |
|
120 |
[2014.12] Study of stacked-emitter layer for high efficiency amorphous/crystalline silicon heterojun... |
°ü¸®ÀÚ |
1672 |
2022-03-21 |
|
119 |
[2022.11] Progressive cooling techniques for photovoltaic module efficiency and reliability: Compara... |
°ü¸®ÀÚ |
1671 |
2023-12-18 |
|