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[2012.04] Spectroscopic ellipsometry analysis of amorphous silicon thin films for Si-nanocrystals
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  ÀÌÀü±Û  [2012.04] Operation mechanism of Schottky barrier nonvolatile memory with high conductivity InGaZnO active layer
  ´ÙÀ½±Û  [2012.04] Effect of carrier injection stress in thin film solar cells by impedance spectroscopy
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