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									[2019.05] The Characteristics of Transparent Non-Volatile Memory Devices Employing Si-Rich SiOX as a Charge Trapping Layer and Indium-Tin-Zinc-Oxide
								

								

									
										

											

												작성자: 관리자
												
																																					조회: 1418													등록일: 2022-03-21												
											

																					

											
								

								

									
								

								

								
									

									

									
									
										
							

							

								
						

						

							
				

				

					
						

							

								
									

									

										
												
												
											

									

										
							

						

							
				

			

				
	

	

		
			
			

        

         
      

				

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					  이전글
					 [2019.05] Effects of post-metallisation annealing on surface–interfacial and electrical properties of HfO2/Ge stacks modified in situ with SiO2 interfacial layer
				

				

					   다음글
					 [2019.05] The recorded open-circuit voltage and fill factor achievement of a-Si:H p-i-n/HIT-type tandem solar cells by tuning up the crystalline in tunneling recombination junction layer
				

				

				

			

				
	

	

		
			

				
				

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	343
	
	[2022.08] Crystalline silicon photovoltaic module degradation: Galvanic corrosion and its solution
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	289
	2023-12-18




	


	342
	
	[2022.04] Application of noble cerium-based anti-corrosion sealing coating approach applied on elect...
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	255
	2023-12-18




	


	341
	
	[2022.03] Optimisation of four-terminal GaAs//Si tandem solar cells using numerical simulation
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	285
	2023-12-18




	


	340
	
	[2022.02] Dopant-grading proposal for polysilicon passivating contact in crystalline silicon solar c...
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	3908
	2022-03-21




	


	339
	
	[2022.01] Novel synthesis of a self-healing Ce based eco-friendly sealing coating to mitigate corros...
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	3755
	2022-03-21




	


	338
	
	[2022.01] High-efficiency hybrid solar cell with a nano-crystalline silicon oxide layer as an electr...
	관리자
	
	
	3808
	2022-03-21




	


	337
	
	[2022.01] Simulated Study and Surface Passivation of Lithium Fluoride-Based Electron Contact for Hig...
	관리자
	
	
	3716
	2022-03-21




	


	336
	
	[2021.12] Numerical Simulation and Experiment of a High-Efficiency Tunnel Oxide Passivated Contact (...
	관리자
	
	
	3743
	2022-03-21




	


	335
	
	[2021.12] Prediction of Dielectric Breakdown of OHTL Insulators Using Contact Angle Measurements
	관리자
	
	
	3676
	2022-03-21




	


	334
	
	[2021.12] Improvement of the Charge Retention of a Non-Volatile Memory by a Bandgap-Engineered Charg...
	관리자
	
	
	3637
	2022-03-21




	


	333
	
	[2021.11] Optimisation of four-terminal GaAs//Si tandem solar cells using numerical simulation
	관리자
	
	
	3593
	2022-03-21




	


	332
	
	[2021.11] Application of hydrophobic coating to reduce leakage current through surface energy contro...
	관리자
	
	
	3611
	2022-03-21




	


	331
	
	[2021.11] Role of electron carrier selective contact layer of lithium fluoride films with wide bandg...
	관리자
	
	
	3623
	2022-03-21




	


	330
	
	[2021.10] Analysis of solder joint degradation and output power drop in silicon photovoltaic modules...
	관리자
	
	
	3652
	2022-03-21




	


	329
	
	[2021.09] Investigation of degradation mechanisms in small scaled amorphous-indium-gallium-zinc-oxid...
	관리자
	
	
	3650
	2022-03-21




	

				
				

				

				

				

					
						

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